JPH0235265B2 - - Google Patents

Info

Publication number
JPH0235265B2
JPH0235265B2 JP54029337A JP2933779A JPH0235265B2 JP H0235265 B2 JPH0235265 B2 JP H0235265B2 JP 54029337 A JP54029337 A JP 54029337A JP 2933779 A JP2933779 A JP 2933779A JP H0235265 B2 JPH0235265 B2 JP H0235265B2
Authority
JP
Japan
Prior art keywords
delay time
integrated circuit
under test
input
lsi
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP54029337A
Other languages
English (en)
Japanese (ja)
Other versions
JPS55122170A (en
Inventor
Ichiro Midorikawa
Yasunori Kanai
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP2933779A priority Critical patent/JPS55122170A/ja
Publication of JPS55122170A publication Critical patent/JPS55122170A/ja
Publication of JPH0235265B2 publication Critical patent/JPH0235265B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Measurement Of Unknown Time Intervals (AREA)
JP2933779A 1979-03-15 1979-03-15 Method of measuring lag time of integrated circuit Granted JPS55122170A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2933779A JPS55122170A (en) 1979-03-15 1979-03-15 Method of measuring lag time of integrated circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2933779A JPS55122170A (en) 1979-03-15 1979-03-15 Method of measuring lag time of integrated circuit

Publications (2)

Publication Number Publication Date
JPS55122170A JPS55122170A (en) 1980-09-19
JPH0235265B2 true JPH0235265B2 (en]) 1990-08-09

Family

ID=12273412

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2933779A Granted JPS55122170A (en) 1979-03-15 1979-03-15 Method of measuring lag time of integrated circuit

Country Status (1)

Country Link
JP (1) JPS55122170A (en])

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3134141A1 (de) * 1981-08-28 1983-03-17 Basf Ag, 6700 Ludwigshafen 2h-1,2,4,6-thiatriazin(3)on-1,1-dioxide, verfahren zur ihrer herstellung und ihre verwendung zur bekaempfung unerwuenschten pflanzenwuchses
JPS5940276A (ja) * 1982-08-31 1984-03-05 Matsushita Electric Ind Co Ltd 電力増幅器
JPS5940275A (ja) * 1982-08-31 1984-03-05 Matsushita Electric Ind Co Ltd コレクタ損失算出装置
US5499190A (en) * 1992-01-16 1996-03-12 Hamamatsu Photonics K.K. System for measuring timing relationship between two signals

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5542420Y2 (en]) * 1976-07-26 1980-10-04

Also Published As

Publication number Publication date
JPS55122170A (en) 1980-09-19

Similar Documents

Publication Publication Date Title
US6931338B2 (en) System for providing a calibrated path for multi-signal cables in testing of integrated circuits
US6105157A (en) Salphasic timing calibration system for an integrated circuit tester
US5521513A (en) Manufacturing defect analyzer
US5047725A (en) Verification and correction method for an error model for a measurement network
US6058496A (en) Self-timed AC CIO wrap method and apparatus
JP2000171529A (ja) 回路欠陥検出システム及び回路欠陥検出方法
US6784819B2 (en) Measuring skew between digitizer channels using fourier transform
US6812727B2 (en) Semiconductor integrated circuit device and testing method thereof
US6876938B2 (en) Method to provide a calibrated path for multi-signal cables in testing of integrated circuits
JPH0235265B2 (en])
US5124849A (en) Data storage media certification process
US5809034A (en) Apparatus and method for operating electronic device testing equipment in accordance with a known overall timing accuracy parameter
US6124724A (en) Method of increasing AC testing accuracy through linear extrapolation
JP2002221556A (ja) 集積回路のパッド受信器のテストを容易にするためのシステム及び方法
US6870781B2 (en) Semiconductor device verification system and method
US7084648B2 (en) Semiconductor testing
JPH10170585A (ja) 回路基板検査方法
JPH0519018A (ja) 半導体測定回路
JPS6222103B2 (en])
JP2678082B2 (ja) 半導体素子の測定方法
JP2924995B2 (ja) 論理機能試験方法およびその装置
JPH0472584A (ja) 集積回路試験装置
JPH09325174A (ja) 半導体検査装置
JPH0340835B2 (en])
JPS5987377A (ja) 半導体テスタ